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Volumn , Issue , 2008, Pages 21-24
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Design and analysis of a TB/sec memory system
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Author keywords
[No Author keywords available]
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Indexed keywords
AND MODELS;
BIT ERRORS;
DESIGN AND ANALYSES;
INTERCONNECT TECHNOLOGIES;
INTERFACE TECHNOLOGIES;
MEMORY COSTS;
MEMORY INTERFACES;
MEMORY SYSTEMS;
PROTOTYPE SYSTEMS;
SYSTEM ANALYSIS;
SYSTEM LEVELS;
VOLTAGE MARGINS;
BIT ERROR RATE;
DATA TRANSFER;
DATA TRANSFER RATES;
DESIGN;
ELECTRONICS PACKAGING;
TIME MEASUREMENT;
TIMING CIRCUITS;
COST BENEFIT ANALYSIS;
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EID: 58049107857
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/EPEP.2008.4675866 Document Type: Conference Paper |
Times cited : (8)
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References (5)
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