Feasibility analysis of solid immersion lens-based dual-layer near-field recording optics with a numerical aperture of 1.84

Optics Communications

Volumn 282, Issue 4, 2009, Pages 540-545

  Kim, Wan Chin ^a   Yoon, Yong Joong ^a   Choi, Hyun ^a   Park, No Cheol ^a   Park, Kyoung Su ^a   Park, Young Pil ^a  

^a Yonsei University   (South Korea)

Author keywords

Dual recording layered optics; Near field recording (NFR); Phase aberration compensation

Indexed keywords

ABERRATIONS; DIFFRACTION; ELECTRIC FIELDS; LIGHT; LIGHT MEASUREMENT; LIGHT SOURCES; LIQUID CRYSTALS; OPTICAL DEVICES; OPTICAL PROPERTIES; OPTICAL SYSTEMS; RADIOACTIVE MATERIALS; REFRACTIVE INDEX; SEMICONDUCTOR QUANTUM DOTS;

CORRECTION METHODS; DEFOCUS; DUAL-RECORDING LAYERED OPTICS; ELECTRIC FIELD CALCULATIONS; EXIT PUPILS; FEASIBILITY ANALYSES; HIGH NUMERICAL APERTURES; IMAGING OPTICS; LAYER STACKS; LINEAR PHASE; NEAR-FIELD RECORDING (NFR); NUMERICAL APERTURES; OPTICAL-; PHASE ABERRATION COMPENSATION; PRACTICAL IMPLEMENTATIONS; RADIAL DIRECTIONS; RECORDING LAYERS; SOLID IMMERSION LENSES; SPACER LAYERS; SPHERICAL ABERRATIONS; SPOT QUALITIES; THREE PHASE;

OPTICAL RECORDING;

EID: 57849153899     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2008.10.062     Document Type: Article

References (14)

1. van den Eerenbeemd J.M.A., Bruls D.M., Verschuren C.A., Yin B., and Zijp F. Jpn. J. Appl. Phys. 46 (2007) 3894
2. Verschuren C.A., Bruls D.M., Yin B., van den Eerenbeemd J.M.A., and Zijp F. Jpn. J. Appl. Phys. 46 (2007) 3889
3. Lee J.U., Shin Y.S., Kim G., Han In.G., Seo J.K., Choi In.H., and Min B.H. Tech. Dig. ISOM (2007) 80 2007
4. Kim J., Bae J., Hwang I., Lee J., Park H., Chung C., Kim H., Park I., and Tominaga J. Jpn. J. Appl. Phys. 46 (2007) 3933
5. Kim H., Kim J., Park C., Jung M., Ro M., and Park I. Jpn. J. Appl. Phys. 45 (2006) 1374
6. Zijp F., van der Mark M.B., Lee J.I., Verschuren C.A., Hendriks B.H.W., Balistreri M.L.M., Urbach H.P., van der Aa M.A.H., and Padiy A.V. Proc. SPIE 5380 (2004) 209
7. van den Eerenbeemd J.M.A., Zijp F., and Stallinga S. Proc. SPIE 6282A (2006) 62820Q-1-10
8. Jo J.S., Milster T.D., and Erwin J.K. Opt. Eng. 41 (2002) 1866
9. F. Zijp, Ph.D. Dissertation, Technische Universiteit Delft, 2007.
10. J. van den Eerenbeemd, Ph.D. Dissertation, Technische Universiteit Delft, 2008.
11. Stallinga S. Appl. Opt. 44 (2005) 849
12. van de Nes A., Billy L., Pereira S., and Braat J. Opt. Exp. 12 (2004) 1281
13. Kim W., Yoon Y., Choi H., Park N., and Park Y. Opt. Exp. 16 (2008) 13933
14. Nakaoki A., Saito K., Yamasaki T., Yukumoto T., Ishimoto T., Kim S., Kondo T., Mizukuki T., Kawakubo O., Honda M., Shinohara N., and Saito N. Tech. Dig. ISOM/ODS 2008 (2008) 199