Random signal characteristics of super resolution near field structure read-only memory disc

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 2 B, 2006, Pages 1374-1378

  Kim, Hyunki ^a   Kim, Jooho ^a   Park, Changmin ^a   Jung, Moonil ^a   Ro, Myongdo ^a   Park, Insik ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

50 GB; bER; CNR; Noise; Random signal; Readout power margin; Super resolution

Indexed keywords

BIT ERROR RATE; LASER OPTICS; MAXIMUM LIKELIHOOD ESTIMATION; PHASE LOCKED LOOPS; SIGNAL PROCESSING;

CNR; RANDOM SIGNAL; SUPER RESOLUTION;

OPTICAL RESOLVING POWER;

EID: 33644512072     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.45.1374     Document Type: Article

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