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Volumn , Issue , 2008, Pages 1163-1166

Yield model characterization for analog integrated circuit using pareto-optimal surface

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS; LINEAR INTEGRATED CIRCUITS; MONTE CARLO METHODS; MULTIOBJECTIVE OPTIMIZATION; NETWORKS (CIRCUITS);

EID: 57849122189     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICECS.2008.4675065     Document Type: Conference Paper
Times cited : (7)

References (12)
  • 7
    • 84893728799 scopus 로고    scopus 로고
    • HOLMES: Capturing the yield-optimized design space boundaries of analog and RF Integrated Circuits
    • Europe Conference and Exhibition
    • B. D. Smedt, G. Gielen, "HOLMES: Capturing the yield-optimized design space boundaries of analog and RF Integrated Circuits." In Proc. Of the Design, Automation and Test in Europe Conference and Exhibition, 2003
    • (2003) Proc. Of the Design, Automation and Test
    • Smedt, B.D.1    Gielen, G.2
  • 9
    • 57849151527 scopus 로고    scopus 로고
    • Hajela, P., Lee, E. and C.Y. , Genetic Algorithms in structural topology optimization. In Proc. Of the NATO Advanced Research Workshop on Topology Design of Structures 1993, pp. 117-133.
    • Hajela, P., Lee, E. and C.Y. , "Genetic Algorithms in structural topology optimization. In Proc. Of the NATO Advanced Research Workshop on Topology Design of Structures 1993, pp. 117-133.
  • 12
    • 27944490894 scopus 로고    scopus 로고
    • Deterministic Approaches to Analog Performance Space Exploration (PSE)
    • DAC
    • D.Mueller, G.Stehr, H. Graeb and U. Schlichtmann, "Deterministic Approaches to Analog Performance Space Exploration (PSE)", in Proc. DAC 2005, pp 869-874.
    • (2005) in Proc , pp. 869-874
    • Mueller, D.1    Stehr, G.2    Graeb, H.3    Schlichtmann, U.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.