Photothermal measurements on optical thin films

Applied Optics

Volumn 34, Issue 31, 1995, Pages 7239-7253

  Welsch, E ^a   Ristau, D ^b  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b LASER ZENTRUM HANNOVER E V   (Germany)

Author keywords

Bulk absorption; Elastic thin film properties; Interface absorption; Laser radiation resistivity; Optical; Optical thin films; Photothermal technique; Surface absorption; Thermal

Indexed keywords

INTERFACES (MATERIALS); LASER DAMAGE; THIN FILMS;

BULK ABSORPTION; ELASTIC THIN FILMS; OPTICAL; OPTICAL THIN FILMS; PHOTO-THERMAL TECHNIQUES; SURFACE ABSORPTION; THERMAL;

OPTICAL FILMS;

EID: 0001398662     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.34.007239     Document Type: Article

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