The Measurement of the Properties of Materials

Proceedings of the IEEE

Volumn 74, Issue 1, 1986, Pages 183-199

  Afsar, Mohammed Nurul ^a,b   Birch, James R ^c   Clarke, R N ^c   Chantry, G W ^d  

^a CITY COLLEGE OF NEW YORK   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c National Physical Laboratory Division of Electrical Sciences ^*  (United States)

^d NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISCRETE-FREQUENCY AND BROAD-BAND METHODS; FOURIER TRANSFORM SPECTROSCOPY; GUIDED AND FREE-SPACE METHODS; TIME- AND FREQUENCY-DOMAIN MEASUREMENT METHODS;

DIELECTRIC MATERIALS - MEASUREMENTS; MAGNETIC MATERIALS - MEASUREMENTS; MATHEMATICAL TRANSFORMATIONS - FOURIER TRANSFORMS; MICROWAVE MEASUREMENTS;

MATERIALS;

EID: 0022488559     PISSN: 00189219     EISSN: 15582256     Source Type: Journal    
DOI: 10.1109/PROC.1986.13432     Document Type: Article

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