Analysis of Naive Bayes' assumptions on software fault data: An empirical study

Data and Knowledge Engineering

Volumn 68, Issue 2, 2009, Pages 278-290

  Turhan, Burak ^a   Bener, Ayse ^a  

^a BOGAZICI UNIVERSITY   (Turkey)

Author keywords

Empirical study; Naive Bayes; Software defect prediction

Indexed keywords

DEFECTS; ELECTRIC FAULT LOCATION; FORECASTING; NASA;

EMPIRICAL STUDY; FEATURE SUBSET SELECTIONS; INDEPENDENCE ASSUMPTIONS; NAIVE BAYES; PRE-PROCESSING; PREDICTION PERFORMANCES; SOFTWARE DEFECT PREDICTION; SOFTWARE DEFECTS; SOFTWARE FAULTS; STATIC CODES; TEST TIMES;

SOFTWARE TESTING;

EID: 57649232840     PISSN: 0169023X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.datak.2008.10.005     Document Type: Article

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