Defect prediction for embedded software

22nd International Symposium on Computer and Information Sciences, ISCIS 2007 - Proceedings

Volumn , Issue , 2007, Pages 346-351

  Oral, Ataç Deniz ^a   Bener, Ayşe Başar ^a  

^a BOGAZICI UNIVERSITY   (Turkey)

Author keywords

Defect prediction; Embedded software; Machine learning; Metrics; Software quality

Indexed keywords

ARSENIC COMPOUNDS; ARTIFICIAL INTELLIGENCE; COMMUNICATION; COMPUTER SOFTWARE SELECTION AND EVALUATION; CYBERNETICS; DEFECTS; EMBEDDED SYSTEMS; FORECASTING; INFORMATION MANAGEMENT; INFORMATION SCIENCE; LEARNING ALGORITHMS; LEARNING SYSTEMS; SOFTWARE TESTING; UBIQUITOUS COMPUTING; WELL TESTING;

DEFECT PREDICTION; DEVELOPMENT CYCLES; EMBEDDED SOFTWARES; END PRODUCTS; HIGH QUALITY (HQ); INTERNATIONAL SYMPOSIUM; MACHINE LEARNING TECHNIQUES; NEW APPROACHES; NO DEFECTS; ON TIME; SOFTWARE DEFECTS; SOFTWARE DEVELOPERS; SOFTWARE SYSTEMS;

COMPUTER SOFTWARE;

EID: 48649106337     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCIS.2007.4456886     Document Type: Conference Paper

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