Nobel a-Si:H gate drivers with high reliability

IDW '06 - Proceedings of the 13th International Display Workshops

Volumn 2, Issue , 2006, Pages 757-760

  Koo, Ja Hun ^a   Choi, Jae Won ^a   Kim, Young Seoung ^a   Kang, Moon Hyo ^a   Ahn, Ki Wan ^a   Lee, Seung Woo ^a   Jang, Jin ^a  

^a Kyung Hee University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

TECHNICAL PRESENTATIONS; THRESHOLD VOLTAGE; TRANSISTORS;

AC BIASES; DC DRIVINGS; GATE DRIVERS; HIGH RELIABILITIES; LIFE TIMES;

AUTOMOBILE DRIVERS;

EID: 57649195302     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. B. S. Bae, J. W Choi, J. H. Oh and J. Jang, "Level Shifter Embedded in Drive Circuits With Amorphous Silicon TFTs", IEEE Trans. Electron Devices, Vol. 52, 494-498(2006)
2. J. W. Choi, Y. S. Kim, M. H. Kang, B. S. Bae, and J. Jang, "Amorphous Silicon Gate Driver with Low Voltage Clock", ITC'06, 86-89(2006)
3. V. M. Da Costa and R. A. Martin, "Amorphous Silicon Shift Register for Addressing Output Drivers", IEEE Journal of Solid State Circuit, Vol. 29, 596-599(1994)
4. B. Kim, Y. H. Jang, S. Y. Yoon, M. D. Chun, H. N. Cho, I.-J. Chung, "A-Si Gate Driver Integration with Time Shared Data Driving", IDW/AD'05, Vol. 2, 1073-1076(2005)
5. B. S. Bae, J. W. Choi, J. H. Oh, K. M. Kim, and J. Jang, "Stability of Hydrogenated Amorphous Silicon TFT Driver", JID'05, Vol. 6, 12-16(2005)
6. J. W. Choi, J. H. Oh, S. H. Kim, J. H. Hur, B. S. Bae and J. Jang, "Stability of DC-DC converter Using Hydrogenated Amorphous Thin-Film Transistors", J. Korean Phy. Soc., Vol. 48, S98-S101 (2006)
7. C.-C. Wei, W.-C. Lin, S.-H. Lo, C.-J. Chang, Y.-E. Wu, "Integrated Gate Driver Circuit Using a-Si TFT", IDW/AD'05, Vol. 2, 1023-1025(2005)
8. M. Chun, Y. Ho Jang, S. Y. Yoon, B. Kim, H. N. Cho, C.-D. Kim, I.-J. Chung, "Integrated Gate Driver Using Highly Stable a-Si TFT's", IDW/AD'05, Vol. 2, 1077-1080(2005)