Large-scale SnO2 nanowires synthesized by direct sublimation method and their enhanced dielectric responses

Materials Letters

Volumn 63, Issue 3-4, 2009, Pages 357-359

  Li, P G ^a   Lei, M ^a   Wang, X ^b   Tang, W H ^a  

^a ZHEJIANG SCI TECH UNIVERSITY   (China)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Dielectrics; Microstructure; Nanomaterials

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC WIRE; FREQUENCY RESPONSE; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; OXIDE MINERALS; POLARIZATION; SILICON CARBIDE; SUBLIMATION; TITANIUM OXIDES;

AVERAGE DIAMETERS; DIELECTRIC MEASUREMENTS; DIELECTRIC RESPONSES; DIELECTRICS; FREQUENCY RANGES; NANOMATERIALS; SIC SUBSTRATES; SPACE CHARGE POLARIZATIONS; STARTING MATERIALS; SUBLIMATION METHODS;

NANOWIRES;

EID: 57649184013     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2008.10.026     Document Type: Article

References (23)

1. Ansari S.G., Boroojerdian P., Sainkar S.R., Karekar R.N., Alyer R.C., and Kulkarni S.K. Thin Solid Films 295 (1997) 2716
2. Watson J. Sensors Actuators 5 (1984) 29-42
3. Faglia G., Baratto C., Sberveglien G., Zha M., and Zappettini A. Appl Phys Lett 86 (2005) 011923-1-3
4. Prins M.W.J., Grosse-Holz K.O., Cillessen J.F.M., and Feiner L.F. J Appl Phys 83 (1998) 888-893
5. Gu F., Wang S.F., Lu M.K., Qi Y.X., Zhou G.J., Xu D., et al. Chem Phys Lett 372 (2003) 451-454
6. Kim T.W., Lee D.U., Lee J.H., Choo D.C., Jung M., and Yoon Y.S. J Appl Phys 90 (2001) 175-180
7. Pan Z.W., Dai Z.R., and Wang Z.L. Science 291 (2001) 1947-1949
8. Lee J.S., Sim S.K., Min B., Cho K., Kim S.W., and Kim S. J Cryst Growth 267 (2004) 145-149
9. Firooz A.A., Mahjoub A.R., and Khodadadi A.A. Mater. Lett. 62 (2008) 1789-1792
10. Wang W.Z., Niu J.Z., and Ao L. J Cryst Growth 310 (2008) 351-355
11. Kolmakov A., Klenov D.O., Liach Y., Stemmer S., and Moskovits M. Nano Lett 5 (2005) 667-673
12. Yu W.D., Li X.M., Gao X.D., and Wu F. J Phys Chem B 109 (2005) 17078-17081
13. Zhang D.H., Liu Z.Q., Li C., Tang T., Liu X.L., Han S., et al. Nano Lett 4 (2004) 1919-1924
14. Patolsky F., Zheng G.F., Hayden O., Lakadamyali M., Zhuang X.W., and Lieber C.M. Proc. Natl Acad Sci USA 101 (2004) 14017-14022
15. Dutta K., and De S.K. J Appl Phys 102 (2007) 084110-084117
16. Bose A.C., Balaya P., Thangadurai P., Ramasamy S., and Ramasamy S. J Phys Chem Solids 64 (2003) 659-663
17. Thangadurai P., Bose A.C., Ramasamy S., Kesavamoorthy R., and Ravindran T.R. J Phys Chem Solids 66 (2005) 1621-1627
18. Xi L.J., Qian D., Huang X.H., and Wang H.E. J Alloys compd 462 (2008) 42-46
19. Boguslawski P., Briggs E.L., and Bernholc J. Phys Rev B 51 (1995) 17255-17258
20. Perlin P., Suski T., and Teisseyre H. Phys Rev Lett 75 (1995) 296-299
21. Chen B., Sha J., Ye X.S., Jiao Z.G., and Zhang L.D. Science China 42 (1999) 510-516
22. Wang W.Y., Xu Y.P., Zhang D.F., and Chen X.L. Mater Res Bull 36 (2001) 2155-2162
23. Xu Y.P., Wang W.Y., Zhang D.F., and Chen X.L. J Mater Sci 36 (2001) 4401-4403