Measurement of nanoparticle sizes by conventional optical microscopy with standing evanescent field illumination

Optics Letters

Volumn 33, Issue 23, 2008, Pages 2794-2796

  Yu, Xiang ^a   Araki, Yukihiro ^a   Iwami, Kentaro ^a   Umeda, Norihiro ^a  

^a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; NANOPARTICLES; PARTICLE SIZE;

A-PARTICLES; CONVENTIONAL OPTICAL MICROSCOPES; DIFFRACTION LIMITS; EVALUATION FACTOR; INTENSITY FRINGES; NANOPARTICLE SIZES; SCATTERING INTENSITY; SIZE MEASUREMENTS;

EVANESCENT FIELDS;

NANOPARTICLE;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; ILLUMINATION; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; MICROSCOPY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; ULTRASTRUCTURE;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; LIGHTING; MICROSCOPY; NANOPARTICLES; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 57649180876     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.33.002794     Document Type: Article

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