Preparation and characterization of Cd2Nb2O7 thin films on Si substrates

Journal of Physics and Chemistry of Solids

Volumn 70, Issue 1, 2009, Pages 234-237

  Ronconi, Célia M ^a   Gonçalves, Débora ^b   Suvorova, Nathalia ^c   Alves, Oswaldo L ^d   Irene, Eugene A ^c  

^a FEDERAL UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

^c The University of North Carolina at Chapel Hill   (United States)

^d UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

A. Ceramics; A. Nanostructures; A. Oxides; A. Thin films; D. Dielectric properties

Indexed keywords

CERAMIC CAPACITORS; CERAMIC MATERIALS; DECOMPOSITION; DIELECTRIC PROPERTIES; EMISSION SPECTROSCOPY; FIELD EMISSION; FILM PREPARATION; NANOSTRUCTURES; NIOBIUM; OPTICAL PROPERTIES; POLYMORPHISM; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; THIN FILMS;

A. CERAMICS; A. NANOSTRUCTURES; A. OXIDES; A. THIN FILMS; D. DIELECTRIC PROPERTIES;

CADMIUM;

EID: 57649158759     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2008.10.006     Document Type: Article

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