Microstructure and electrical properties of La0.7Sr0.3MnO3 thin films deposited by metallo-organic decomposition method

Journal of Crystal Growth

Volumn 293, Issue 1, 2006, Pages 68-73

  Wang, Zhan Jie ^a   Usuki, Hirokazu ^a   Kumagai, Toshihide ^a   Kokawa, Hiroyuki ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

A1. Crystal structure; A1. Microstructure; A1. X ray diffraction; B1. Oxides; B1. Perovskites; B2. Electric materials

Indexed keywords

CRYSTAL STRUCTURE; ELECTRIC PROPERTIES; GRAIN SIZE AND SHAPE; LANTHANUM COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; PEROVSKITE; SILICA; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ANNEALING TEMPERATURE; LANTHANUM STRONTIUM MANGANATE; LOWER RESISTIVITY; PACKED GRAINS;

THIN FILMS;

EID: 33746125388     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.05.014     Document Type: Article

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