Near field imaging of terahertz focusing onto rectangular apertures

Optics Express

Volumn 16, Issue 25, 2008, Pages 20484-20489

  Seo, M A ^a   Adam, A J L ^b   Kang, J H ^c   Lee, J W ^a   Ahn, K J ^a   Park, Q H ^c   Planken, P C M ^b   Kim, D S ^a  

^a Seoul National University   (South Korea)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS;

CONSTANT ENERGY; ELECTROOPTIC CRYSTALS; FIELD ENHANCEMENT; NARROW SLITS; NEAR FIELD IMAGING; NEAR FIELDS; RECTANGULAR APERTURE; SINGLE RECTANGULAR HOLE;

OPTICS;

ARTICLE; METHODOLOGY; MICROSCOPY; REFRACTOMETRY; TERAHERTZ RADIATION; TERAHERTZ SPECTROSCOPY;

MICROSCOPY; REFRACTOMETRY; TERAHERTZ RADIATION; TERAHERTZ SPECTROSCOPY;

EID: 57349085141     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.020484     Document Type: Article

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