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Volumn 121, Issue 1, 2002, Pages 199-210

Visualization and characterization of electroactive defects in the native oxide film on aluminium

Author keywords

[No Author keywords available]

Indexed keywords


EID: 57249111560     PISSN: 13596640     EISSN: 13645498     Source Type: Journal    
DOI: 10.1039/b201539k     Document Type: Article
Times cited : (50)

References (22)
  • 22
    • 85034312833 scopus 로고    scopus 로고
    • manuscript in preparation
    • S. Lee and H. S. White, manuscript in preparation.
    • Lee, S.1    White, H.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.