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Volumn 121, Issue 1, 2002, Pages 199-210
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Visualization and characterization of electroactive defects in the native oxide film on aluminium
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 57249111560
PISSN: 13596640
EISSN: 13645498
Source Type: Journal
DOI: 10.1039/b201539k Document Type: Article |
Times cited : (50)
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References (22)
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