Low-noise in-pixel comparing active pixel sensor using column-level single-slope ADC

IEEE Transactions on Electron Devices

Volumn 55, Issue 12, 2008, Pages 3383-3388

  Lee, Dongmyung ^a   Cho, Kunhee ^a   Kim, Dongsoo ^a   Han, Gunhee ^a  

^a Yonsei University   (South Korea)

Author keywords

CMOS active pixel sensor (APS); Column level ADC; Readout noise; Source follower (SF)

Indexed keywords

IMAGE SENSORS; MULTICARRIER MODULATION; PHASE SHIFTERS; SENSORS;

ACTIVE PIXEL SENSORS; CMOS ACTIVE PIXEL SENSOR (APS); CMOS PROCESSES; COLUMN-LEVEL ADC; NOISE REDUCTIONS; NON LINEARITIES; PIXEL READOUTS; PROTOTYPE SENSORS; READOUT NOISE; SENSITIVITY ENHANCEMENTS; SOURCE FOLLOWER (SF); SOURCE FOLLOWERS;

PIXELS;

EID: 57149140608     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.2006735     Document Type: Article

References (22)

1. B. S. Carlson, "Comparison of modern CCD and CMOS image sensor technologies and systems for low resolution imaging," in Proc. Sensors, Jun. 2002, vol. 1, pp. 171-176.
2. I. Takayanagi, M. Shirakawa, K. Mitani, S. Iversen, J. Moholt, and E. R. Fossum, "A 1.25-inch 60-frames/s 8.3-M-pixel digital-output CMOS image sensor," IEEE J. Solid State Circuits, vol. 40, no. 11, pp. 2305-2314, Nov. 2005.
3. C. C. Hsieh, C. Y. Wu, F. W. Jih, and T. P. Sun, "Focal-plane-arrays and CMOS readout techniques of infrared imaging systems," IEEE Trans. Circuits Syst. Video Technol., vol. 7, no. 4, pp. 594-605, Aug. 1997.
4. M. J. Loinaz, K. J. Singh, A. J. Blanksby, D. A. Inglis, K. Azadet, and B. D. Ackland, "A 200-mW, 3.3-V, CMOS color camera IC producing 352 × 288 24-b video at 30 frames/s," IEEE J. Solid State Circuits, vol. 33, no. 12, pp. 2092-2103, Dec. 1998.
5. J. Zarnowski, M. Pace, and M. Joyner, "1.5 FET per pixel standard CMOS active column sensor," Proc. SPIE, vol. 3649, pp. 186-196, Jan. 1999.
6. A. M. Fowler and I. Gatley, "Demonstration of an algorithm for read-noise reduction in infrared arrays," Astrophys. J., vol. 353, pp. L33-L34, Apr. 1990.
7. S. Kawahito, N. Kawai et al., "A high-sensitivity oversampling digital signal detection technique for CMOS image sensors using non-destructive intermediate high-speed readout mode," in Proc. IEEE Workshop CCD AIS, 2001, pp. 24-27.
8. N. Kawai and S. Kawahito, "A low-noise oversampling signal detection technique for CMOS image sensors," in Proc. IEEE Instrum. Meas. Technol. Conf., Anchorage, AK, May 2002, pp. 256-268.
9. S. Kawahito, M. Sakahibara, D. Handoko, N. Nakamura, H. Satoh, M. Higashi, K. Mabuchi, and H. Sumi, "A column-based pixel-gain-adaptive CMOS image sensor for low-light-level imaging," in Proc. ISSCC Tech. Dig., 2003, pp. 224-490.
10. - noise 1.3 megapixel CMOS sensor," in Proc. IEEE Workshop CCD AIS, 2003, pp. 1-6.
11. N. Kawai and S. Kawahito, "Noise analysis of high-gain, low-noise column readout circuits for CMOS image sensors," IEEE Trans. Electron Devices, vol. 51, no. 2, pp. 185-194, Feb. 2004.
12. S. Kleinfelder, S. Lim, X. Liu, and A. E. Gamal, "A 10000 frames/s CMOS digital pixel sensor," IEEE J. Solid State Circuits, vol. 36, no. 12, pp. 2049-2059, Dec. 2001.
13. A. Kitchen, A. Bermak, and A. Bouzerdoum, "A digital pixel sensor array with programmable dynamic range," IEEE Trans. Electron Devices, vol. 52, no. 12, pp. 2591-2601, Dec. 2005.
14. D. Kim and G. Han, "A low noise and low power CMOS image sensor with pixel-level correlated double sampling," in Proc. IEEE Workshop Des. Diagnostics Electron. Circuits Syst., Apr. 2007, pp. 113-115.
15. S. Yoshihara, Y. Nitta, M. Kikuchi, K. Koseki, Y. Ito, Y. Inada, S. Kuramochi, H. Wakabayashi, M. Okano, H. Kuriyama, J. Inutsuka, A. Tajima, T. Nakajima, Y. Kudoh, F. Koga, Y. Kasagi, and S. Watanabe, "A 1/1.8-inch 6.4 MPixel 60 frames/s CMOS image sensor with seamless mode change," IEEE J. Solid State Circuits, vol. 41, no. 12, pp. 2998-3006, Dec. 2006.
16. O. Yadid-Pecht, B. Mansoorian, E. R. Fossum, and B. Pain, "Optimization of noise and responsivity in CMOS active pixel sensors for detection of ultra low light levels," Proc. SPIE, vol. 3019, pp. 125-136, Feb. 1997.
17. S. K. Mendis, S. E. Kemeny, R. C. Gee, B. Pain, C. O. Staller, Q. Kim, and E. R. Fossum, "CMOS active pixel image sensors for highly integrated imaging systems," IEEE J. Solid State Circuits, vol. 32, no. 2, pp. 187-197, Feb. 1997.
18. H. Tian, B. Fowler, and A. E. Gamal, "Analysis of temporal noise in CMOS photodiode active pixel sensor," IEEE J. Solid State Circuits vol. 36, no. 1, pp. 92-101, Jan. 2001.
19. H. Takahashi, M. Kinoshita, K. Morita, T. Shirai, T. Sato, T. Kimura, H. Yuzurihara, S. Inoue, and S. Matsumoto, "A 3.9 μm pixel pitch VGA format 10 b digital image sensor with 1.5 transistors/pixel," in Proc. ISSCC Tech. Dig., 2004, pp. 108-109.
20. M. Mori, M. Katsuno, S. Kasuga, T. Murata, and T. Yamaguchi, "A 1/4 in 2 M pixel CMOS image sensor with 1.75 transistor/pixel," in Proc. ISSCC Tech. Dig., 2004, pp. 110-111.
21. B. Razavi, Design of Analog CMOS Integrated Circuits. Chicago, IL: McGraw-Hill, 2001.
22. B. C. Burkey, W. C. Chang, T. H. Lee, T. J. Tredwell, J. P. Lavine, and E. A. Trabka, "The pinned photodiode for an interline-transfer CCD image sensor," in IEDM Tech. Dig., 1984, pp. 28-31.