Degraded OFF-state current of organic thin-film transistor and annealing effect

IEEE Transactions on Electron Devices

Volumn 55, Issue 12, 2008, Pages 3602-3604

  Hong, Sunghun ^a   Choi, Jongsun ^a   Kim, Youngmin ^a  

^a Hong Ik University   (South Korea)

Author keywords

Anneal; Gate dielectric; Organic thin film transistor (OTFT); Pentacene; Polystyrene (PS)

Indexed keywords

CHEMICAL SENSORS; DIELECTRIC MATERIALS; GATES (TRANSISTOR); MOS CAPACITORS; POLYSTYRENES; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM DEVICES; THIN FILM TRANSISTORS;

AIR EXPOSURES; ANNEALING EFFECTS; GATE LEAKAGE CURRENTS; GATE LEAKAGES; GLASS TEMPERATURES; INSULATION PROPERTIES; ORGANIC THIN-FILM TRANSISTOR (OTFT); PENTACENE; STATE CURRENTS; TRAP GENERATIONS;

GATE DIELECTRICS;

EID: 57149129581     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.2006550     Document Type: Article

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