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Volumn 112, Issue 45, 2008, Pages 17709-17715

CoFe prussian blue analogues under variable pressure. Evidence of departure from cubic symmetry: X-ray diffraction and absorption study

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; DIFFRACTION; ELECTROLYSIS; ELECTROMAGNETIC WAVE ABSORPTION; ELECTRON TRANSITIONS; ENERGY ABSORPTION; VANADIUM COMPOUNDS; X RAY ANALYSIS; X RAY DIFFRACTION;

EID: 57049109254     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp805852n     Document Type: Article
Times cited : (45)

References (37)
  • 24
    • 57049166422 scopus 로고    scopus 로고
    • The structure of the noncubic phases can be described in different ways: the rhombohedral primitive cell, the corresponding hexagonal unit cell, or the rhombohedral face-centered cell that we choose to work with here in order to compare the rhombohedral phase to the cubic one
    • The structure of the noncubic phases can be described in different ways: the rhombohedral primitive cell, the corresponding hexagonal unit cell, or the rhombohedral face-centered cell that we choose to work with here in order to compare the rhombohedral phase to the cubic one.
  • 25
    • 57049121074 scopus 로고    scopus 로고
    • R* value can be calculated but the value does vary in a correlated way with pressure.
    • R* value can be calculated but the value does vary in a correlated way with pressure.
  • 28
    • 23044461813 scopus 로고    scopus 로고
    • V. Escax, V; Champion, G.; Arrio, M.-A.; Zacchigna, M.; Cartier dit, Moulin.; Bleuzen, A. Angew. Chem., Int. Ed. 2005, 44, 4798-4801.
    • (b) V. Escax, V; Champion, G.; Arrio, M.-A.; Zacchigna, M.; Cartier dit, Moulin.; Bleuzen, A. Angew. Chem., Int. Ed. 2005, 44, 4798-4801.
  • 29
    • 57049175860 scopus 로고    scopus 로고
    • 2 was collected at room pressure with a X'pert Philips diffractometer. A silicon plate was used for the angle calibration. The α* value (90.13 ± 0.03°) was calculated from equation (2) and the angle position of the 200 and 220 diffraction lines which were obtained by fitting the peaks to Gaussian line shape.
    • 2 was collected at room pressure with a X'pert Philips diffractometer. A silicon plate was used for the angle calibration. The α* value (90.13 ± 0.03°) was calculated from equation (2) and the angle position of the 200 and 220 diffraction lines which were obtained by fitting the peaks to Gaussian line shape.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.