Femtosecond laser surface texturing of a nickel-based superalloy

Applied Surface Science

Volumn 255, Issue 5 PART 2, 2008, Pages 2796-2802

  Semaltianos, N G ^a   Perrie, W ^a   French, P ^a   Sharp, M ^a   Dearden, G ^a   Watkins, K G ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

Atomic force microscopy; Femtosecond laser ablation; Laser surface texturing; Roughness; Scanning electron microscopy

Indexed keywords

ABLATION; ATOMIC FORCE MICROSCOPY; FEMTOSECOND LASERS; LASER ABLATION; LASER BEAMS; NICKEL; NICKEL ALLOYS; SCANNING ELECTRON MICROSCOPY; SUPERALLOYS; SURFACE MORPHOLOGY; SURFACE TREATMENT;

ABLATION DEPTH; FEMTOSECONDS; FLUENCES; LASER MICRO-MACHINING; LASER SURFACE TEXTURING; MACROSCOPIC DIMENSIONS; NICKEL- BASED SUPERALLOYS; VOLUME ABLATION;

SURFACE ROUGHNESS;

EID: 56949091346     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.08.043     Document Type: Article

References (16)

1. Liu X., Du D., and Mourou G. IEEE J. Quant. Electronics 33 (1997) 1706
2. Laser Ablation and Micromachining with Ultrashort Laser Pulses, Clark-MXR Inc., http://www.cmxr.com/.
3. Chichkov B.N., Momma C., Nolte S., von Alvensleben F., and Tünnermann A. Appl. Phys. A 63 (1996) 109
4. Schilchting H., and Gersten K. Boundary-Layer Theory. 8th edition (2001), Springer-Verlag
5. Kanokjaruvijit K., and Martinez-botas R.F. Int. J. Heat Mass Transfer 48 (2005) 161
6. Wang X., Zhu J.Y., Chen W., and Cai L. Int. J. Comp. Appl. Technol. 29 (2007) 114
7. Strickland D., and Mourou G. Opt. Commun. 56 (1985) 219
8. Betteridge W., and Heslop J. The Nimonic Alloys (1974), Edward Arnold, UK
9. van Driel H.M., Sipe J.E., and Young J.F. Phys. Rev. Lett. 49 (1982) 1955
10. Fauchet P.M., and Siegman A.E. Appl. Phys. A 32 (1983) 135
11. Guosheng Z., Fauchet P.M., and Siegman A.E. Phys. Rev. B 26 (1982) 5366
12. Costache F., Henyk M., and Reif J. Appl. Surf. Sci. 186 (2002) 352
13. Reif J., Costache F., Henyk M., and Pandelov S.V. Appl. Surf. Sci. 197 (2002) 891
14. Henyk M., Vogel N., Wolfframm D., Tempel A., and Reif J. Appl. Phys. A 69 (1999) S355
15. Ameer-Beg S., Perrie W., Rathbone S., Wright J., Weaver W., and Chapmoux H. Appl. Surf. Sci. 127 (1998) 875
16. Borowiec A., and Haugen H.K. Appl. Phys. Lett. 82 (2003) 4462