Syntheses and characterization of TiC/a:C composite coatings using pulsed closed field unbalanced magnetron sputtering (P-CFUBMS)

Thin Solid Films

Volumn 517, Issue 3, 2008, Pages 1131-1135

  Lin, J ^a   Moore, J J ^a   Mishra, B ^a   Pinkas, M ^b   Sproul, W D ^a,c  

^a Department of Geology and Geological Engineering   (United States)

^b NUCLEAR RESEARCH CENTER NEGEV   (Israel)

^c Reactive Sputtering INC   (United States)

Author keywords

Nanocomposite coatings; Pulsed Magnetron Sputtering (PMS); TiC a:C; Wear

Indexed keywords

AMORPHOUS CARBON; ARGON; CARBON; COATINGS; COMPOSITE COATINGS; CONCENTRATION (PROCESS); FREE VOLUME; FRICTION; GRAPHITE; HARDENING; HARDNESS; INERT GASES; INORGANIC COATINGS; MAGNETRONS; MICROSCOPIC EXAMINATION; NANOCOMPOSITES; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLINE MATERIALS; NANOSTRUCTURED MATERIALS; PHOTOELECTRON SPECTROSCOPY; PROTECTIVE COATINGS; TEMPERATURE INDICATING CAMERAS; TITANIUM; TITANIUM CARBIDE; X RAY ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS MATRIXES; ARGON ATMOSPHERES; CARBON CONCENTRATIONS; CARBON CONTENTS; CLOSED FIELD UNBALANCED MAGNETRON SPUTTERING; COATING COMPOSITIONS; COATING HARDNESSES; FREE CARBONS; GRAPHITE TARGETS; HIGH CARBON CONTENTS; HIGH HARDNESSES; LOW COEFFICIENT OF FRICTIONS; LOW WEAR RATES; NANOCOMPOSITE COATINGS; NANOCRYSTALLINE; PULSED MAGNETRON SPUTTERING (PMS); SLIDING FRICTIONS; STRUCTURE AND PROPERTIES; TIC/A:C; WEAR; WEAR RATES; X-RAY DIFFRACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

MAGNETRON SPUTTERING;

EID: 56649099067     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.07.021     Document Type: Article

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