On-state reliability of solid-electrolyte switch

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2008, Pages 707-708

  Banno, N ^a   Sakamoto, T ^a   Fujieda, S ^a   Aono, M ^b  

^a NEC CORPORATION   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SOLID ELECTROLYTES;

NANO BRIDGES; PROGRAMMABLE LOGICS; RELIABILITY PHYSICS; TURN-OFF;

RELIABILITY;

EID: 51549085039     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2008.4558999     Document Type: Conference Paper

References (5)

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3. T. Sakamoto et al., Symp. VLSI Tech. Dig. 38 (2007).
4. S. Yokogawa et al., Microelectronics Reliability 41, 1409 (2001).
5. J. Greene et al., Proc. of The IEEE 81, 1042 (1993).