Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regression

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 1110-1112

  Kim, Young Pil ^a   Hong, Mi Young ^a   Shon, Hyun Kyong ^b   Chegal, Won ^b   Cho, Hyun Mo ^b   Moon, Dae Won ^b   Kim, Hak Sung ^a   Lee, Tae Geol ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Research Institute of Standards and Science   (South Korea)

Author keywords

Dendrimer; Ellipsometry; PCA; Quantification; SAM; Streptavidin; ToF SIMS

Indexed keywords

DENDRIMERS; ELLIPSOMETRY; IONS; PROTEINS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SELF ASSEMBLED MONOLAYERS;

POLYAMIDOAMINE DENDRIMERS; PRINCIPAL COMPONENT REGRESSION; PROTEIN CONCENTRATIONS; PROTEIN QUANTIFICATION; QUANTIFICATION; STREPTAVIDIN; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS;

PRINCIPAL COMPONENT ANALYSIS;

EID: 56449131621     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.044     Document Type: Article

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