-
1
-
-
5644220388
-
-
ANSYS Inc., Canonsburg, PA
-
ANSYS 6.1, 2001. ANSYS Inc., Canonsburg, PA.
-
(2001)
ANSYS 6.1
-
-
-
4
-
-
0345959892
-
Realistic modeling of edge effect stresses in bimaterial elements
-
Eischen, J.W., Chung, C., Kim, J.H., 1990. Realistic modeling of edge effect stresses in bimaterial elements. ASME Journal of Electronic Packaging (112), 16-23.
-
(1990)
ASME Journal of Electronic Packaging
, Issue.112
, pp. 16-23
-
-
Eischen, J.W.1
Chung, C.2
Kim, J.H.3
-
5
-
-
0039972857
-
Interlaminar thermoelastic stresses in layered beams
-
Grimado, P.B., 1978. Interlaminar thermoelastic stresses in layered beams. Journal of Thermal Stresses (1), 75-86.
-
(1978)
Journal of Thermal Stresses
, Issue.1
, pp. 75-86
-
-
Grimado, P.B.1
-
6
-
-
0014496559
-
The end problem for a laminated elastic strip-I. The general solution
-
Hess, M.S., 1969a. The end problem for a laminated elastic strip-I. The general solution. Journal of Composite Materials (3), 262-280.
-
(1969)
Journal of Composite Materials
, Issue.3
, pp. 262-280
-
-
Hess, M.S.1
-
7
-
-
84964140678
-
The end problem for a laminated elastic strip-II. Differential expansion stresses
-
Hess, M.S., 1969b. The end problem for a laminated elastic strip-II. Differential expansion stresses. Journal of Composite Materials (3), 630-641.
-
(1969)
Journal of Composite Materials
, Issue.3
, pp. 630-641
-
-
Hess, M.S.1
-
8
-
-
0037109227
-
Thermal stresses in elastic multilayer systems
-
Hsueh, C.H., 2002. Thermal stresses in elastic multilayer systems. Thin Solid Films (418), 182-188.
-
(2002)
Thin Solid Films
, Issue.418
, pp. 182-188
-
-
Hsueh, C.H.1
-
9
-
-
5644229809
-
-
Mathsoft Engineering & Education, Inc., Cambridge, MA
-
MathCAD 6.0 Std Ed. 1995. Mathsoft Engineering & Education, Inc., Cambridge, MA.
-
(1995)
MathCAD 6.0 Std Ed.
-
-
-
10
-
-
0037370259
-
A simple and fundamental design rule for resisting delamination in bimaterial structures
-
Moore, T.D., Jarvis, J.L., 2003. A simple and fundamental design rule for resisting delamination in bimaterial structures. Microelectronics Reliability (43), 487-494.
-
(2003)
Microelectronics Reliability
, Issue.43
, pp. 487-494
-
-
Moore, T.D.1
Jarvis, J.L.2
-
12
-
-
0026172299
-
Interfacial shear and peel stresses in multilayered thin stacks subjected to uniform thermal loading
-
Pao, Y.-H., Eisele, E., 1991. Interfacial shear and peel stresses in multilayered thin stacks subjected to uniform thermal loading. ASME Journal of Electronic Packaging (113), 164-172.
-
(1991)
ASME Journal of Electronic Packaging
, Issue.113
, pp. 164-172
-
-
Pao, Y.-H.1
Eisele, E.2
-
13
-
-
0013363608
-
Interfacial thermal stresses in bimaterial elastic beams: Modified beam models revisited
-
Ru, C.Q., 2002. Interfacial thermal stresses in bimaterial elastic beams: modified beam models revisited. ASME Journal of Electronic Packaging (124), 141-146.
-
(2002)
ASME Journal of Electronic Packaging
, Issue.124
, pp. 141-146
-
-
Ru, C.Q.1
-
14
-
-
0022787978
-
Stresses in bi-metal thermostats
-
Suhir, E., 1986. Stresses in bi-metal thermostats. ASME Journal of Applied Mechanics (53), 657-660.
-
(1986)
ASME Journal of Applied Mechanics
, Issue.53
, pp. 657-660
-
-
Suhir, E.1
|