Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si-SiO2 interface

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 21, Issue 10, 2004, Pages 2019-2022

  Azzam, R M A ^a   Spinu, Cristina L ^a  

^a UNO College of Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; DIELECTRIC MATERIALS; FUSED SILICA; INTERFACES (MATERIALS); LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT TRANSMISSION; REFRACTIVE INDEX;

DIELECTRIC-DIELECTRIC INTERFACES; QUARTER WAVE RETARDERS; TOTAL INTERNAL REFLECTION;

PRISMS;

EID: 5644257355     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.21.002019     Document Type: Article

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