3D tomographic EBSD measurements of heavily deformed ultra fine grained Cu-0.17wt%Zr obtained from ECAP

Materials Science Forum

Volumn 584-586 PART 1, Issue , 2008, Pages 434-439

  Khorashadizadeh, Anahita ^a   Winning, Myrjam ^a   Raabe, Dierk ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

3D EBSD; 3D orientation microscopy; Equal channel angular pressing; Focussed ion beam technique

Indexed keywords

BACKSCATTERING; BINARY ALLOYS; COPPER ALLOYS; COPPER METALLOGRAPHY; EQUAL CHANNEL ANGULAR PRESSING; FIELD EMISSION MICROSCOPES; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; ION BEAMS; NANOSTRUCTURED MATERIALS; PLASTIC DEFORMATION; POLYCRYSTALLINE MATERIALS; PRESSING (FORMING); SCANNING ELECTRON MICROSCOPY; TEXTURES; TOPOLOGY; ZIRCALOY;

3D EBSD; 3D ORIENTATION MICROSCOPY; FOCUSSED ION BEAM TECHNIQUE; GRAIN BOUNDARY TOPOLOGY; HEAVILY DEFORMED; SERIAL SECTIONING; THREE-DIMENSIONAL ORIENTATION; ULTRA-FINE-GRAINED;

ZIRCONIUM METALLOGRAPHY;

EID: 56349167627     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.584-586.434     Document Type: Conference Paper

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