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Volumn 10, Issue , 2008, Pages

On the internal energy of sputtered clusters

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; INDIUM; IONIZATION; LASER EXCITATION; LASERS; MASS SPECTROMETERS; MASS SPECTROMETRY; NOZZLES; PHOTONS; XENON;

EID: 56349163045     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/10/10/103007     Document Type: Article
Times cited : (15)

References (63)
  • 5
    • 0342827726 scopus 로고    scopus 로고
    • ed A Benninghoven, B Hagenhoff and H W Werner (Chichester, UK: Wiley) p
    • Wucher A and Wahl M 1997 Secondary Ion Mass Spectrometry (SIMS X) ed A Benninghoven, B Hagenhoff and H W Werner (Chichester, UK: Wiley) p 65
    • (1997) Secondary Ion Mass Spectrometry (SIMS X) , pp. 65
    • Wucher, A.1    Wahl, M.2
  • 32
    • 56349114761 scopus 로고    scopus 로고
    • Dzhemilev N Kh, Maksimov S E and Solomko V V 2000 Secondary Ion Mass Spectrometry (SIMS XII) ed A Benninghoven, P Bertrand, H N Migeon and H W Werner (Amsterdam: Elsevier) p 839
    • Dzhemilev N Kh, Maksimov S E and Solomko V V 2000 Secondary Ion Mass Spectrometry (SIMS XII) ed A Benninghoven, P Bertrand, H N Migeon and H W Werner (Amsterdam: Elsevier) p 839
  • 33
    • 56349171547 scopus 로고    scopus 로고
    • Bekkerman A D, Dzhemilev N Kh, Veryovkin I V and Verkhoturov S V 1997 Secondary Ion Mass Spectrometry (SIMS X) ed A Benninghoven, B Hagenhoff and H W Werner (Chichester: Wiley) p 403
    • Bekkerman A D, Dzhemilev N Kh, Veryovkin I V and Verkhoturov S V 1997 Secondary Ion Mass Spectrometry (SIMS X) ed A Benninghoven, B Hagenhoff and H W Werner (Chichester: Wiley) p 403


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.