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Volumn 42, Issue 19, 2007, Pages 8334-8341

Determination of crystallographic orientation of dwell-fatigue fracture facets in Ti-6242 alloy

Author keywords

[No Author keywords available]

Indexed keywords

CRACK INITIATION; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; FATIGUE OF MATERIALS; SCANNING ELECTRON MICROSCOPY;

EID: 34547442040     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-006-0252-z     Document Type: Article
Times cited : (78)

References (13)
  • 11
    • 0002411714 scopus 로고    scopus 로고
    • Schwartz AJ, Kumar M, Adams BL (eds) Kluwer Academic/Plenum Publishers, New York, NY
    • Wright SI (2000) In: Schwartz AJ, Kumar M, Adams BL (eds) Electron backscatter diffraction in materials science. Kluwer Academic/Plenum Publishers, New York, NY, p 51
    • (2000) Electron Backscatter Diffraction in Materials Science , pp. 51
    • Wright, S.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.