Band gap energies and refractive indices of epitaxial Pb 1-xSrxTe thin films

Chinese Physics Letters

Volumn 25, Issue 9, 2008, Pages 3334-3337

  Weng, Bin Bin ^a   Wu, Hui Zhen ^a   Si, Jian Xiao ^a   Xu, Tian Ning ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; ENERGY GAP; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LATTICE CONSTANTS; LEAD COMPOUNDS; MOLECULAR BEAM EPITAXY; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

BAND GAP ENERGY; FOURIER TRANSFORM INFRARED; HIGH RESOLUTION XRAY DIFFRACTION (XRD); HIGH-RESOLUTION X-RAY DIFFRACTION DATA; INFRARED TRANSMISSION SPECTRA; INFRARED TRANSMISSION SPECTROSCOPY; MOLECULAR-BEAM EPITAXY; REFRACTIVE INDEX DISPERSION; THIN-FILMS; VEGARD'S LAW;

REFRACTIVE INDEX;

EID: 56349143307     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/25/9/064     Document Type: Article

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