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Volumn 83, Issue 1, 1998, Pages 616-618

An approach to the energy gap determination from reflectance measurements

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0003023961     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366650     Document Type: Article
Times cited : (9)

References (13)
  • 5
    • 0003517146 scopus 로고
    • Mir, Moscow
    • P. Kiréev, La Physique des Semiconducteurs (Mir, Moscow, 1975); P. Y. Yu and M. Cardona, Fundamentals of Semiconductors: Physics and Materials Properties (Springer, Berlin, 1996).
    • (1975) La Physique des Semiconducteurs
    • Kiréev, P.1
  • 8
    • 0003835355 scopus 로고
    • Wiley, New York
    • F. Bassani and G. Pastori Parravicini, Electronic States and Optical Transitions in Solids, edited by R. A. Ballinger (Pergamon, Oxford, 1975); S. L. Chuang, Physics of Optoelectronic Devices (Wiley, New York, 1995).
    • (1995) Physics of Optoelectronic Devices
    • Chuang, S.L.1
  • 12
    • 33847596250 scopus 로고
    • Ellipsometric Software v. 2.1β Library
    • D. E. Aspnes and A. A. Studna, Phys. Rev. B 27, 985 (1983); Ellipsometric Software v. 2.1β Library.
    • (1983) Phys. Rev. B , vol.27 , pp. 985
    • Aspnes, D.E.1    Studna, A.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.