Growth and characterization of IV-VI semiconductor heterostructures on (100) BaF2

Thin Solid Films

Volumn 323, Issue 1-2, 1998, Pages 126-135

  Chao, I Na ^a   McCann, Patrick J ^a   Yuan, Wei Li ^a   O'Rear, Edgar A ^a   Yuan, Shu ^b  

^a University of Oklahoma   (United States)

^b AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

Epilayers; Heterostructures; Liquid phase epitaxy; Wipeoffs

Indexed keywords

ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INCLUSIONS; LASER TUNING; LIGHT ABSORPTION; LIQUID PHASE EPITAXY; MORPHOLOGY; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR GROWTH; SEMICONDUCTOR LASERS; SUBSTRATES;

WIPEOFFS;

HETEROJUNCTIONS;

EID: 0032098739     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01047-X     Document Type: Article

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