SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 93, Issue 19, 2008, Pages

Direct characterization of focusing light by negative refraction in a photonic crystal flat lens

(7) Tian, Jie a Yan, Min a Qiu, Min a Ribbing, Carl G b Liu, Ya Zhao c Zhang, Dao Zhong c Li, Zhi Yuan c

a ROYAL INSTITUTE OF TECHNOLOGY (Sweden)

b UPPSALA UNIVERSITY (Sweden)

c INSTITUTE OF PHYSICS (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERIZED TOMOGRAPHY; LENSES; OPTICAL INSTRUMENTS; PHOTONIC CRYSTALS; POWDERS; SILICON;

AT WAVELENGTHS; BEAM PROFILES; DIRECT MILLINGS; DIRECT OBSERVATIONS; EXPERIMENTAL MEASUREMENTS; FIELD DISTRIBUTIONS; FLAT LENSES; FREE SPACES; FULL WIDTH HALF MAXIMUMS; LATERAL POSITIONS; LIGHT SPOTS; NEGATIVE REFRACTIONS; PHOTONIC CRYSTAL SLABS; SILICON ON INSULATORS;

CRYSTAL ATOMIC STRUCTURE;

EID: 56249148163 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3027069 Document Type: Article

Times cited : (10)

References (17)

1
- 0034296247
- 0031-9007 10.1103/PhysRevLett.85.3966.
- J. B. Pendry, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.85.3966 85, 3966 (2000).
- (2000) Phys. Rev. Lett. , vol.85 , pp. 3966
- Pendry, J.B.¹

2
- 0035815370
- 0036-8075 10.1126/science.1058847.
- R. A. Shelby, D. R. Smith, and S. Schultz, Science 0036-8075 10.1126/science.1058847 292, 77 (2001).
- (2001) Science , vol.292 , pp. 77
- Shelby, R.A.¹ Smith, D.R.² Schultz, S.³

3
- 34247474730
- 0036-8075 10.1126/science.1139266.
- H. J. Lezec, J. A. Dionne, and H. A. Atwater, Science 0036-8075 10.1126/science.1139266 316, 430 (2007).
- (2007) Science , vol.316 , pp. 430
- Lezec, H.J.¹ Dionne, J.A.² Atwater, H.A.³

4
- 2942525140
- 0028-0836 10.1038/nature02575.
- J. Valentine, S. Zhang, T. Zentgraf, E. U. Avila, D. A. Genov, G. Bartal, and X. Zhang, Nature (London) 0028-0836 10.1038/nature02575 429, 538 (2008).
- (2008) Nature (London) , vol.429 , pp. 538
- Valentine, J.¹ Zhang, S.² Zentgraf, T.³ Avila, E.U.⁴ Genov, D.A.⁵ Bartal, G.⁶ Zhang, X.⁷

5
- 19444373513
- 0031-9007 10.1103/PhysRevLett.93.073902.
- A. Berrier, M. Mulot, M. Swillo, M. Qiu, L. Thylen, A. Talneau, and S. Anand, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.93.073902 93, 073902 (2004).
- (2004) Phys. Rev. Lett. , vol.93 , pp. 073902
- Berrier, A.¹ Mulot, M.² Swillo, M.³ Qiu, M.⁴ Thylen, L.⁵ Talneau, A.⁶ Anand, S.⁷

6
- 33646896135
- 0163-1829 10.1103/PhysRevB.73.195117.
- E. Schonbrun, T. Yanmashita, W. Park, and C. J. Sunners, Phys. Rev. B 0163-1829 10.1103/PhysRevB.73.195117 73, 195117 (2006).
- (2006) Phys. Rev. B , vol.73 , pp. 195117
- Schonbrun, E.¹ Yanmashita, T.² Park, W.³ Sunners, C.J.⁴

7
- 0034666990
- 0163-1829 10.1103/PhysRevB.62.10696.
- M. Notomi, Phys. Rev. B 0163-1829 10.1103/PhysRevB.62.10696 62, 10696 (2000).
- (2000) Phys. Rev. B , vol.62 , pp. 10696
- Notomi, M.¹

8
- 1042265138
- 0163-1829 10.1103/PhysRevB.68.245110.
- Z. Y. Li and L. L. Lin, Phys. Rev. B 0163-1829 10.1103/PhysRevB.68.245110 68, 245110 (2003).
- (2003) Phys. Rev. B , vol.68 , pp. 245110
- Li, Z.Y.¹ Lin, L.L.²

9
- 33749598667
- 0146-9592 10.1364/OL.31.002786.
- T. Matsumoto, K. S. Eom, and T. Baba, Opt. Lett. 0146-9592 10.1364/OL.31.002786 31, 2786 (2006).
- (2006) Opt. Lett. , vol.31 , pp. 2786
- Matsumoto, T.¹ Eom, K.S.² Baba, T.³

10
- 49549108214
- 0031-9007 10.1103/PhysRevLett.101.073901.
- N. Fabre, L. Lalouat, B. Cluzel, X. Ḿlique, and D. Lippens, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.101.073901 101, 073901 (2008).
- (2008) Phys. Rev. Lett. , vol.101 , pp. 073901
- Fabre, N.¹ Lalouat, L.² Cluzel, B.³ Ḿlique, X.⁴ Lippens, D.⁵

11
- 0036661974
- 1077-260X 10.1109/JSTQE.2002.800845.
- W. Bogaerts, V. Wiaux, D. Taillaert, S. Beckx, B. Luyssaert, P. Bienstman, and R. Baets IEEE J. Sel. Top. Quantum Electron. 1077-260X 10.1109/JSTQE.2002.800845 8, 928 (2002).
- (2002) IEEE J. Sel. Top. Quantum Electron. , vol.8 , pp. 928
- Bogaerts, W.¹ Wiaux, V.² Taillaert, D.³ Beckx, S.⁴ Luyssaert, B.⁵ Bienstman, P.⁶ Baets, R.⁷

12
- 33750284186
- 1094-4087 10.1364/OE.14.010014.
- C. Ren, J. Tian, S. Feng, H. H. Tao, Y. Z. Liu, K. Ren, Z. Y. Li, B. Y. Cheng, D. Z. Zhang, and H. F. Yang, Opt. Express 1094-4087 10.1364/OE.14.010014 14, 10014 (2006).
- (2006) Opt. Express , vol.14 , pp. 10014
- Ren, C.¹ Tian, J.² Feng, S.³ Tao, H.H.⁴ Liu, Y.Z.⁵ Ren, K.⁶ Li, Z.Y.⁷ Cheng, B.Y.⁸ Zhang, D.Z.⁹ Yang, H.F.¹⁰

13
- 33846060801
- 1009-1963 10.1088/1009-1963/15/11/001.
- J. Tian, C. Ren, S. Feng, Y. Z. Liu, H. H. Tiao, Z. Y. Li, B. Y. Cheng, D. Z. Zhang, and A. Z. Jin, Chin. Phys. 1009-1963 10.1088/1009-1963/15/11/001 15, 2471 (2006).
- (2006) Chin. Phys. , vol.15 , pp. 2471
- Tian, J.¹ Ren, C.² Feng, S.³ Liu, Y.Z.⁴ Tiao, H.H.⁵ Li, Z.Y.⁶ Cheng, B.Y.⁷ Zhang, D.Z.⁸ Jin, A.Z.⁹

14
- 2942514361
- 0022-2720 10.1111/j.0022-2720.2004.01327.x.
- S. Rubanov and P. R. Munroe, J. Microsc. 0022-2720 10.1111/j.0022-2720. 2004.01327.x 214, 213 (2004).
- (2004) J. Microsc. , vol.214 , pp. 213
- Rubanov, S.¹ Munroe, P.R.²

15
- 33748545654
- 0021-4922
- M. Tanaka, M. Tymczenko, T. Asano, and S. Noda, Jpn. J. Appl. Phys. 45, 6096 (2006). 0021-4922
- (2006) Jpn. J. Appl. Phys. , vol.45 , pp. 6096
- Tanaka, M.¹ Tymczenko, M.² Asano, T.³ Noda, S.⁴

16
- 0034497169
- 0361-5235 10.1007/s11664-000-0122-4.
- L. Liao, D. R. Lim, A. M. Agarwal, X. Duan, K. K. Lee, and L. C. Kimerling, J. Electron. Mater. 0361-5235 10.1007/s11664-000-0122-4 29, 1380 (2000).
- (2000) J. Electron. Mater. , vol.29 , pp. 1380
- Liao, L.¹ Lim, D.R.² Agarwal, A.M.³ Duan, X.⁴ Lee, K.K.⁵ Kimerling, L.C.⁶

17
- 34249017276
- 1041-1135
- J. Schrauwen, F. V. Laere, D. V. Thourhout, and R. Baets, IEEE Photonics Technol. Lett. 19, 816 (2007). 1041-1135
- (2007) IEEE Photonics Technol. Lett. , vol.19 , pp. 816
- Schrauwen, J.¹ Laere, F.V.² Thourhout, D.V.³ Baets, R.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.