Statistical analysis of the metrological properties of float glass

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7077, Issue , 2008, Pages

  Yates, Brian W ^a   Duffy, Alan M ^a  

^a CANADIAN LIGHT SOURCE INC   (Canada)

Author keywords

Optical metrology; Slope error; Surface metrology; Surface profiler; Surface roughness; X ray optics

Indexed keywords

ACIDS; ELECTROMAGNETIC WAVES; FRICTION; GLASS; LIGHT; LIGHT SOURCES; LIGHTING; METAL ANALYSIS; OPTICAL GLASS; SULFURIC ACID; SURFACE PROPERTIES; SURFACE ROUGHNESS; TIN; TITANIUM COMPOUNDS;

OPTICAL METROLOGY; SLOPE ERROR; SURFACE METROLOGY; SURFACE PROFILER; X-RAY OPTICS;

SURFACE TREATMENT;

EID: 56249146321     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.795278     Document Type: Conference Paper

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