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Volumn 5, Issue 6, 2008, Pages 1662-1664
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High quality, high efficiency and ultrahigh In-content InGaN QWs - The problem of thermal stability
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTACT LAYERS;
CRITICAL TEMPERATURES;
DEVICE APPLICATION;
ELEVATED TEMPERATURE;
EMISSION WAVELENGTH;
GAN CAP;
HETEROSTRUCTURES;
HIGH EFFICIENCY;
HIGH QUALITY;
INDIUM CONCENTRATION;
INTER-DIFFUSION;
INTERNAL QUANTUM EFFICIENCY;
LIGHT EMITTERS;
NITROGEN BONDS;
OUT-DIFFUSION;
PL INTENSITY;
POST ANNEALING;
QUANTUM WELL;
SYSTEMATIC STUDY;
THERMAL STABILITY;
GALLIUM ALLOYS;
GALLIUM NITRIDE;
INDIUM;
PHASE INTERFACES;
PHASE SEPARATION;
SEMICONDUCTOR GROWTH;
THERMOGRAVIMETRIC ANALYSIS;
QUANTUM EFFICIENCY;
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EID: 56249117056
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200778575 Document Type: Conference Paper |
Times cited : (12)
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References (5)
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