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Volumn 1, Issue , 2006, Pages 141-150

System modeling with dynamic reliability block diagrams

Author keywords

[No Author keywords available]

Indexed keywords

BOOLEAN ALGEBRA; COMPUTER SYSTEMS; DYNAMICAL SYSTEMS; FAILURE ANALYSIS; FAULT TREE ANALYSIS; QUALITY ASSURANCE; REDUNDANCY; RISK MANAGEMENT; SCHRODINGER EQUATION; SEMICONDUCTOR DEVICE MODELS;

EID: 56249108428     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (12)

References (19)
  • 1
    • 0033872918 scopus 로고    scopus 로고
    • A modeling framework to implement preemption policies in non-markovian spns
    • Bobbio, A., A. Puliafito, and M. Telek (2000). A modeling framework to implement preemption policies in non-markovian spns. IEEE Transaction on Software Engineering 26(1), 36-54.
    • (2000) IEEE Transaction on Software Engineering , vol.26 , Issue.1 , pp. 36-54
    • Bobbio, A.1    Puliafito, A.2    Telek, M.3
  • 2
    • 0141793198 scopus 로고    scopus 로고
    • A new formalism that combines advantages of fault trees and Markov models: Boolean logic driven Markov processes
    • November
    • Bouissou, M. and J.-L. Bonc (2003, November). A new formalism that combines advantages of fault trees and Markov models: Boolean logic driven Markov processes. Reliability Engineering and System Safety 82(2), 149-163.
    • (2003) Reliability Engineering and System Safety , vol.82 , Issue.2 , pp. 149-163
    • Bouissou, M.1    Bonc, J.-L.2
  • 7
    • 0033907723 scopus 로고    scopus 로고
    • Monte Carlo simulation using Excel®spreadsheet for predicting reliability of a complex system
    • Gedam, S.G. and S. Beaudet (2000). Monte Carlo simulation using Excel®spreadsheet for predicting reliability of a complex system. In Reliability and Maintainability Symposium, pp. 188-193.
    • (2000) Reliability and Maintainability Symposium , pp. 188-193
    • Gedam, S.G.1    Beaudet, S.2
  • 8
    • 0038293601 scopus 로고    scopus 로고
    • Institute of Electrical and Electronics Engineers , 7th ed, Los Alamitos, CA, USA
    • Institute of Electrical and Electronics Engineers (2000). The Authoritative Dictionary of IEEE Standards Terms (7th ed.). Los Alamitos, CA, USA.
    • (2000) The Authoritative Dictionary of IEEE Standards Terms
  • 9
    • 56249116495 scopus 로고    scopus 로고
    • Isograph Inc
    • Isograph Inc. (2006). Isograph tool website. www.isograph.com. USA.
    • (2006) Isograph tool website
  • 11
    • 0036890848 scopus 로고    scopus 로고
    • Reliability graph with general gates: An intuitive and practical method for system reliability analysis
    • Kim, M.C. and P.H. Seong (2002). Reliability graph with general gates: An intuitive and practical method for system reliability analysis. Reliability Engineering and System Safety 78(3), 239-246.
    • (2002) Reliability Engineering and System Safety , vol.78 , Issue.3 , pp. 239-246
    • Kim, M.C.1    Seong, P.H.2
  • 14
    • 56249085185 scopus 로고    scopus 로고
    • Reliass Ltd
    • Reliass Ltd. (2006). RAMP tool website. www.reliability-safety-software. com. UK.
    • (2006) RAMP tool website
  • 18
    • 56249134470 scopus 로고    scopus 로고
    • Vesely, W.E., F.F. Goldberg, N.H. Roberts, and D.F. Haasl (1981). Fault Tree Handbook. U. S. Nuclear Regulatory Commission, NUREG-0492, Washington DC.
    • Vesely, W.E., F.F. Goldberg, N.H. Roberts, and D.F. Haasl (1981). Fault Tree Handbook. U. S. Nuclear Regulatory Commission, NUREG-0492, Washington DC.
  • 19
    • 2142697193 scopus 로고    scopus 로고
    • Modeling of system reliability using petri nets with aging tokens
    • Volovoi, V.V. (2004). Modeling of system reliability using petri nets with aging tokens. Reliability Engineering and System Safety 84(2), 149-161.
    • (2004) Reliability Engineering and System Safety , vol.84 , Issue.2 , pp. 149-161
    • Volovoi, V.V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.