A new formalism that combines advantages of fault-trees and Markov models: Boolean logic driven Markov processes

Reliability Engineering and System Safety

Volumn 82, Issue 2, 2003, Pages 149-163

  Bouissou, Marc ^a   Bon, Jean Louis ^b  

^a EDF R AND D   (France)

^b UNIV LILLE   (France)

Author keywords

Approximation; Availability; Dynamic fault tree; Fault tree; Markov chain; Modeling; Petri net; Reliability

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; FAULT TREE ANALYSIS; MARKOV PROCESSES; PETRI NETS;

BINARY DECISION DIAGRAMS (BDD);

RELIABILITY;

EID: 0141793198     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(03)00143-1     Document Type: Article

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