Reliability graph with general gates: An intuitive and practical method for system reliability analysis

Reliability Engineering and System Safety

Volumn 78, Issue 3, 2002, Pages 239-246

  Kim, Man Cheol ^a   Seong, Poong Hyun ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Bayesian network; Reliability analysis; Reliability graph

Indexed keywords

ERROR ANALYSIS; FAILURE ANALYSIS; GRAPH THEORY; RELIABILITY;

GENERAL GATES;

LARGE SCALE SYSTEMS;

EID: 0036890848     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(02)00164-3     Document Type: Article

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