Adsorption of mercaptosilanes on nanocrystalline and single crystal zinc oxide surfaces

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7030, Issue , 2008, Pages

  Singh, Jagdeep ^a   Im, JiSun ^a   Whitten, James E ^a   Soares, Jason W ^b   Meehan, Alexa M ^b   Steeves, Diane M ^b  

^a University of Massachusetts Lowell   (United States)

^b DEVELOPMENT AND ENGINEERING CENTER   (United States)

Author keywords

Metal oxide; Nanocrystalline; Photoelectron spectroscopy; Photoluminescence; Silanes; Thiols; Zinc oxide

Indexed keywords

ADSORPTION; CONDENSATION REACTIONS; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT EMISSION; LUMINESCENCE; METALLIC COMPOUNDS; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLINE MATERIALS; NANOSENSORS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OXIDES; PASSIVATION; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTOLUMINESCENCE; PHOTONS; POWDERS; SEMICONDUCTING ZINC COMPOUNDS; SILANES; SILICON; SINGLE CRYSTAL SURFACES; SINGLE CRYSTALS; SPECTRUM ANALYSIS; SURFACE DEFECTS; VACUUM; ZINC; ZINC ALLOYS; ZINC OXIDE;

BOND FORMATIONS; DODECANETHIOL; ELECTRONIC STRUCTURE AND OPTICAL PROPERTIES; FUNCTIONALIZATION; FUNCTIONALIZED; HYDROXYL GROUPS; MERCAPTOPROPYLTRIMETHOXYSILANE; METAL OXIDE; NANOCRYSTALLINE; OXIDE SURFACES; PHOTOLUMINESCENCE MEASUREMENTS; PHOTOLUMINESCENCE SPECTRUMS; SENSOR APPLICATIONS; SILANE FUNCTIONALIZATION; THIOL GROUPS; THIOLS; UV EMISSIONS; VACUUM CHAMBERS; VISIBLE EMISSIONS; WIDE BANDS; X-RAY PHOTOELECTRON SPECTROSCOPIES; XPS STUDIES; ZNO RODS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 56249101381     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.794805     Document Type: Conference Paper

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