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Volumn 38, Issue 7, 2006, Pages 1139-1145

A NEXAFS orientation study of γ-aminopropyltriethoxysilane on zinc oxide surfaces

Author keywords

NEXAFS; Organosilanes; Thin films; XPS

Indexed keywords

AMINOPROPYLTRIETHOXYSILANE; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE (NEXAFS); ORGANOSILANES; OSCILLATORY ADSORPTION;

EID: 33749622429     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2369     Document Type: Article
Times cited : (20)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.