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Volumn 38, Issue 7, 2006, Pages 1139-1145
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A NEXAFS orientation study of γ-aminopropyltriethoxysilane on zinc oxide surfaces
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Author keywords
NEXAFS; Organosilanes; Thin films; XPS
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Indexed keywords
AMINOPROPYLTRIETHOXYSILANE;
NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE (NEXAFS);
ORGANOSILANES;
OSCILLATORY ADSORPTION;
ADSORPTION;
MATHEMATICAL MODELS;
SPECTROSCOPY;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ZINC OXIDE;
SILANES;
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EID: 33749622429
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.2369 Document Type: Article |
Times cited : (20)
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References (34)
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