Supplier selection for one-sided processes with unequal sample sizes

European Journal of Operational Research

Volumn 195, Issue 2, 2009, Pages 381-393

  Pearn, W L ^a   Hung, H N ^a   Cheng, Ya Ching ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Nonconformities; Process capability index; Supplier selection

Indexed keywords

APPLICATION EXAMPLES; CONFIDENCE LEVELS; CRITICAL VALUES; EXACT APPROACHES; EXISTING METHODS; MANUFACTURING PROCESSES; NONCONFORMITIES; PROCESS CAPABILITY INDEX; SAMPLE SIZES; SELECTION DECISIONS; SUPPLIER SELECTION; SUPPLIER SELECTIONS; TESTING HYPOTHESIS; TWO PHASES; TWO WAVELENGTHS; UNEQUAL SAMPLE SIZES;

PRODUCTION ENGINEERING;

EID: 56249089399     PISSN: 03772217     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ejor.2008.01.050     Document Type: Article

References (17)

1. Bothe, D.R., 1997. A capability study for an entire product. In: ASQC Quality Congress Transactions, Nashville, vol. 46, pp. 172-178.
2. Bothe D.R. A capability index for multiple process streams. Quality Engineering 11 4 (1999) 613-618
3. Bothe D.R. Statistical reason for the 1.5σ shift. Quality Engineering 14 3 (2002) 479-487
4. Boyles R.A. The Taguchi capability index. Journal of Quality Technology 23 1 (1991) 17-26
5. Chou Y.M. Selecting a better supplier by testing process capability indices. Quality Engineering 6 3 (1994) 427-438
6. Huang D.Y., and Lee R.F. Selecting the largest capability index from several quality control processes. Journal of Statistical Planning and Inference 46 3 (1995) 335-346
7. Kane V.E. Process capability indices. Journal of Quality Technology 18 1 (1986) 41-52
8. Kotz S., and Johnson N.L. Process capability indices - A review, 1992-2000. Journal of Quality Technology 34 1 (2002) 1-19
9. Montgomery D.C. Introduction to Statistical Quality Control. 4th ed. (2001), John Wiley & Sons, Inc., New York, NY
10. Pearn W.L., and Chen K.S. Multi-process performance analysis: A case study. Quality Engineering 10 1 (1997) 1-8
11. PL: Decision making with sample information. International Journal of Quality & Reliability Management 19 3 (2002) 221-245
12. pk MPPAC. Microelectronics Reliability 43 6 (2003) 963-975
13. pm with application to production yield assurance. International Journal of Production Research 41 15 (2003) 3581-3599
14. Pearn W.L., and Wu C.W. Variables sampling plans with PPM fraction of defectives and process loss consideration. Journal of Operational Research Society 57 4 (2006) 450-459
15. Pearn W.L., Kotz S., and Johnson N.L. Distributional and inferential properties of process capability indices. Journal of Quality Technology 24 4 (1992) 216-231
16. Pearn W.L., Lin G.H., and Chen K.S. Distributional and inferential properties of the process accuracy and process precision indices. Communications in Statistics: Theory & Methods 27 4 (1998) 985-1000
17. Wu C.W., and Pearn W.L. Measuring manufacturing capability for couplers and wavelength division multiplexers. International Journal of Advanced Manufacturing Technology 25 5-6 (2005) 533-541