Measuring manufacturing capability for couplers and wavelength division multiplexers

International Journal of Advanced Manufacturing Technology

Volumn 25, Issue 5-6, 2005, Pages 533-541

  Wu, Chien Wei ^a   Pearn, W L ^b  

^a FENG CHIA UNIVERSITY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Bootstrap methods; Couplers; Insertion loss; Multiple characteristics; NCPPM; Polarization dependent loss; Process capability indices; Wavelength division multiplexers; Yield analysis

Indexed keywords

DATA COMMUNICATION SYSTEMS; ELECTRIC CONNECTORS; INSERTION LOSSES; MANUFACTURE; POLARIZATION; WIDE AREA NETWORKS;

BOOTSTRAP METHODS; MULTIPLE CHARACTERISTICS; NCPPM; POLARIZATION DEPENDENT LOSS; PROCESS CAPABILITY INDICES;

WAVELENGTH DIVISION MULTIPLEXING;

EID: 20644469689     PISSN: 02683768     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00170-003-1793-9     Document Type: Article

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