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Volumn 71, Issue 5, 2009, Pages 1979-1983
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Growth and characterization of unidirectional 〈1 0 0〉 KDP single crystal by Sankaranarayanan-Ramasamy (SR) method
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a
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Author keywords
Dielectric properties; High resolution; Optical materials
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Indexed keywords
CERAMIC CAPACITORS;
CRYSTAL GROWTH;
CRYSTALLOGRAPHY;
CRYSTALS;
DIELECTRIC LOSSES;
DIELECTRIC MATERIALS;
DIELECTRIC PROPERTIES;
DIFFRACTION;
DIFFRACTOMETERS;
GRAIN BOUNDARIES;
MATERIALS PROPERTIES;
POTASSIUM;
POWDERS;
SEMICONDUCTING SILICON COMPOUNDS;
STRAIN MEASUREMENT;
ULTRAVIOLET SPECTROSCOPY;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
CONVENTIONAL METHODS;
CRYSTALLINE PERFECTIONS;
DIELECTRIC CONSTANTS;
DIFFRACTOMETRY;
DIHYDROGEN;
GLASS AMPOULES;
GROWN CRYSTALS;
HARDNESS VALUES;
HIGH RESOLUTIONS;
HIGH-RESOLUTION;
SEED CRYSTALS;
SR METHODS;
VIS SPECTROSCOPIES;
SINGLE CRYSTALS;
NANOMATERIAL;
PHOSPHATE;
POTASSIUM DERIVATIVE;
POTASSIUM DIHYDROGEN PHOSPHATE;
ARTICLE;
CHEMICAL STRUCTURE;
CHEMISTRY;
CRYSTALLIZATION;
ELECTROCHEMISTRY;
INFRARED SPECTROSCOPY;
METHODOLOGY;
THERMOGRAVIMETRY;
ULTRAVIOLET SPECTROPHOTOMETRY;
X RAY DIFFRACTION;
CRYSTALLIZATION;
ELECTROCHEMISTRY;
MOLECULAR STRUCTURE;
NANOSTRUCTURES;
PHOSPHATES;
POTASSIUM COMPOUNDS;
SPECTROPHOTOMETRY, ULTRAVIOLET;
SPECTROSCOPY, FOURIER TRANSFORM INFRARED;
THERMOGRAVIMETRY;
X-RAY DIFFRACTION;
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EID: 56049102091
PISSN: 13861425
EISSN: None
Source Type: Journal
DOI: 10.1016/j.saa.2008.07.047 Document Type: Article |
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Times cited : (42)
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References (29)
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