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Volumn 35, Issue 1, 2009, Pages 147-149

Phase evolution and electrical properties of lead zirconate titanate thin films grown by using a triol sol-gel route

Author keywords

A. Sol gel processes; D. PZT; Films

Indexed keywords

CERAMIC CAPACITORS; COLLOIDS; DIELECTRIC LOSSES; ELECTRIC PROPERTIES; GELATION; GELS; HYSTERESIS; HYSTERESIS LOOPS; LEAD; MAGNETIC MATERIALS; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SOL-GEL PROCESS; SOL-GELS; SOLIDS; SOLS; SPIN COATING; THICK FILMS; THIN FILMS; TITANIUM; ZIRCONIUM;

EID: 55949091467     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2007.10.038     Document Type: Article
Times cited : (3)

References (8)
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  • 2
    • 0344754646 scopus 로고    scopus 로고
    • Low-leakage epitaxial PZT thin films grown on Ir/MgO substrates by metalorganic chemical vapor deposition
    • Oikawa T., Takahashi K., and Ishida I. Low-leakage epitaxial PZT thin films grown on Ir/MgO substrates by metalorganic chemical vapor deposition. J. Integr. Ferroelectr. 46 (2002) 55
    • (2002) J. Integr. Ferroelectr. , vol.46 , pp. 55
    • Oikawa, T.1    Takahashi, K.2    Ishida, I.3
  • 4
    • 0032319695 scopus 로고    scopus 로고
    • Effect of pyrolysis temperature on the characteristics of PZT films deposited by the sol-gel method
    • Law C.W., Tong K.Y., Li J.H., and Li K. Effect of pyrolysis temperature on the characteristics of PZT films deposited by the sol-gel method. Thin Solid Films 335 (1998) 220
    • (1998) Thin Solid Films , vol.335 , pp. 220
    • Law, C.W.1    Tong, K.Y.2    Li, J.H.3    Li, K.4
  • 5
    • 0035050049 scopus 로고    scopus 로고
    • Phase development and ferroelectric properties of lead zirconate thin films prepared from a triol sol-gel route
    • Naksata M., and Milne S.J. Phase development and ferroelectric properties of lead zirconate thin films prepared from a triol sol-gel route. Int. J. Inorg. Mater. 3 (2001) 169
    • (2001) Int. J. Inorg. Mater. , vol.3 , pp. 169
    • Naksata, M.1    Milne, S.J.2
  • 7
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    • S. Trolier, C.A. Randall, J.P. Maria, C. Theis, D.G. Schlom, J. Shepard Jr., K. Yamakawa, Dependence of electrical properties on film thickness in lanthanum-doped lead zirconate titanate stannate antiferroelectric thin films, Mater. Res. Soc. Symp. Proc., Pittsburg, PA, USA, Nov 27, 1996.
    • S. Trolier, C.A. Randall, J.P. Maria, C. Theis, D.G. Schlom, J. Shepard Jr., K. Yamakawa, Dependence of electrical properties on film thickness in lanthanum-doped lead zirconate titanate stannate antiferroelectric thin films, Mater. Res. Soc. Symp. Proc., Pittsburg, PA, USA, Nov 27, 1996.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.