Microfabricated atomic magnetometers and applications

2008 IEEE International Frequency Control Symposium, FCS

Volumn , Issue , 2008, Pages 789-794

  Kitching, John ^a   Knappe, Svenja ^a   Shah, Vishal ^a   Schwindt, Peter ^a   Griffith, Clark ^a   Jimenez, Ricardo ^a   Preusser, Jan ^a   Liew, L A ^a   Moreland, J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; ATOMS; COMPASSES (MAGNETIC); INSTRUMENT TESTING; MAGNETIC FIELDS; MAGNETIC MEASURING INSTRUMENTS; MAGNETOMETERS;

ATOMIC MAGNETOMETERS; EARTH'S FIELDS; MICRO-ELECTRO-MECHANICAL SYSTEMS; OPTICAL SPECTROSCOPIES; SENSOR HEADS;

ATOMIC PHYSICS;

EID: 55649105649     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FREQ.2008.4623107     Document Type: Conference Paper

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