Distribution of grain boundary planes at coincident site lattice misorientations

Materials Research Society Symposium - Proceedings

Volumn 819, Issue , 2004, Pages 265-275

  Rohrer, Gregory S ^a   El Dasher, Bassem S ^b   Miller, Herbert M ^a   Rollett, Anthony D ^a   Saylor, David M ^c  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c CENTER FOR DRUG EVALUATION AND RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; CRYSTAL LATTICES; CRYSTAL ORIENTATION; INTERFACIAL ENERGY; MAPPING; POLYCRYSTALLINE MATERIALS; SURFACE PROPERTIES;

BOUNDARY PARAMETERS; ELECTRON BACK SCATTERED DIFFRACTION (EBSD); MISORIENTATIONS; PLANAR COINCIDENT SITE DENSITY (PCSD);

GRAIN BOUNDARIES;

EID: 5544325666     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-819-n7.2     Document Type: Conference Paper

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