Single-section plane assessment in grain boundary engineered brass

Journal of Microscopy

Volumn 205, Issue 3, 2002, Pages 253-258

  Davies, H ^a   Randle, Valerie ^a  

^a SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

Electron backscatter diffraction; Grain boundary engineering; Grain boundary plane; Trace analysis; Twin related boundaries

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; TRACE ANALYSIS;

COINCIDENCE SITE LATTICES; COMPARATIVE ANALYZES; DIFFRACTION DATA; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; GRAIN BOUNDARY ENGINEERED; GRAIN BOUNDARY ENGINEERING; GRAIN BOUNDARY PLANE; GRAIN BOUNDARY TYPES; TWIN-RELATED BOUNDARY;

BRASS;

ANALYTIC METHOD; ARTICLE; COMPARATIVE STUDY; CRYSTALLOGRAPHY; DATA ANALYSIS; DIFFRACTION; ELECTRON MICROSCOPY; GRAIN; MEASUREMENT; METHODOLOGY; PRIORITY JOURNAL; TECHNIQUE; VALIDATION PROCESS;

EID: 0036094985     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2002.00989.x     Document Type: Article

References (11)

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