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Volumn 16, Issue 23, 2004, Pages 4149-4155

Defect-induced structural disorder in tetragonal Cu(In1-xGa x)5Se8 thin films investigated by Raman spectroscopy: The effect of Ga addition

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; DATA REDUCTION; EVAPORATION; MOLECULAR STRUCTURE; POLYNOMIALS; RAMAN SPECTROSCOPY; THIN FILMS;

EID: 3042643059     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/23/029     Document Type: Article
Times cited : (17)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.