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Volumn 10, Issue 10, 2008, Pages 973-977
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Microstructure characterisation of electrical discharge craters using FIB/SEM dual beam techniques
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Author keywords
[No Author keywords available]
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Indexed keywords
DISCHARGE (FLUID MECHANICS);
ELECTRIC DISCHARGES;
ELECTRON DIFFRACTION;
FOCUSED ION BEAMS;
METAL MELTING;
MICROSCOPIC EXAMINATION;
MICROSTRUCTURE;
SURFACE DISCHARGES;
WATER POLLUTION;
ARC CRATERS;
CHARACTERISATION;
DUAL BEAMS;
ELECTRICAL DISCHARGES;
ELECTRON BACKSCATTER DIFFRACTIONS;
EXTERNAL PRESSURES;
HEAT FLOWS;
MATERIAL DEGRADATIONS;
MICROSTRUCTURAL;
MOLTEN POOLS;
MULTILAYERED;
NANOTOMOGRAPHY;
NOVEL TECHNIQUES;
TEMPERATURE GRADIENTS;
TWO TYPES;
MOLTEN MATERIALS;
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EID: 55249100273
PISSN: 14381656
EISSN: 15272648
Source Type: Journal
DOI: 10.1002/adem.200800108 Document Type: Article |
Times cited : (8)
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References (20)
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