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Volumn 10, Issue 10, 2008, Pages 973-977

Microstructure characterisation of electrical discharge craters using FIB/SEM dual beam techniques

Author keywords

[No Author keywords available]

Indexed keywords

DISCHARGE (FLUID MECHANICS); ELECTRIC DISCHARGES; ELECTRON DIFFRACTION; FOCUSED ION BEAMS; METAL MELTING; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; SURFACE DISCHARGES; WATER POLLUTION;

EID: 55249100273     PISSN: 14381656     EISSN: 15272648     Source Type: Journal    
DOI: 10.1002/adem.200800108     Document Type: Article
Times cited : (8)

References (20)
  • 19
    • 55249122631 scopus 로고
    • Ed. 15 Casting, ASM International, Metals Park, Ohio
    • R. Trivedi, W. Kurz, inMet. Handbook 9th Ed. 15 (Casting), ASM International, Metals Park, Ohio 1988.
    • (1988) Met. Handbook 9th
    • Trivedi, R.1    Kurz, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.