-
1
-
-
36449006867
-
Silicon field-effect transistor based on quantum tunneling
-
Aug
-
J. Tucker, C. Wang, and P. Carney, "Silicon field-effect transistor based on quantum tunneling," Appl. Phys. Lett., vol. 65, no. 5, pp. 618-620, Aug. 1994.
-
(1994)
Appl. Phys. Lett
, vol.65
, Issue.5
, pp. 618-620
-
-
Tucker, J.1
Wang, C.2
Carney, P.3
-
2
-
-
23944478215
-
A simulation approach to optimize the electrical parameters of a vertical tunnel FET
-
Jul
-
K. K. Bhuwalka, J. Schulze, and I. Eisele, "A simulation approach to optimize the electrical parameters of a vertical tunnel FET," IEEE Trans. Electron Devices, vol. 52, no. 7, pp. 1541-1547, Jul. 2005.
-
(2005)
IEEE Trans. Electron Devices
, vol.52
, Issue.7
, pp. 1541-1547
-
-
Bhuwalka, K.K.1
Schulze, J.2
Eisele, I.3
-
3
-
-
37149019859
-
Device physics and guiding principles for the design of doublegate tunneling field effect transistor with silicon - germanium source heterojunction
-
Dec
-
E. H. Toh, G. H. Wang, L. Chan, G. Samudra, and Y. C. Yeo, "Device physics and guiding principles for the design of doublegate tunneling field effect transistor with silicon - germanium source heterojunction," Appl. Phys. Lett., vol. 91, no. 24, p. 243 505, Dec. 2007.
-
(2007)
Appl. Phys. Lett
, vol.91
, Issue.24
, pp. 243-505
-
-
Toh, E.H.1
Wang, G.H.2
Chan, L.3
Samudra, G.4
Yeo, Y.C.5
-
4
-
-
4544248640
-
Complementary tunneling transistor for low power application
-
Dec
-
P. F. Wang, K. Hilsenbeck, T. Nirschl, M. Oswald, C. Stepper, M. Weis, D. Schmitt-Landsiedel, and W. Hansch, "Complementary tunneling transistor for low power application," Solid State Electron., vol. 48, no. 12, pp. 2281-2286, Dec. 2004.
-
(2004)
Solid State Electron
, vol.48
, Issue.12
, pp. 2281-2286
-
-
Wang, P.F.1
Hilsenbeck, K.2
Nirschl, T.3
Oswald, M.4
Stepper, C.5
Weis, M.6
Schmitt-Landsiedel, D.7
Hansch, W.8
-
5
-
-
0018454952
-
Analytical models of threshold voltage and breakdown voltage of short-channel MOSFETs derived from two-dimensional analysis
-
Apr
-
T. Toyabe and S. Asai, "Analytical models of threshold voltage and breakdown voltage of short-channel MOSFETs derived from two-dimensional analysis," IEEE Trans. Electron Devices, vol. ED-26, no. 4, pp. 453-461, Apr. 1979.
-
(1979)
IEEE Trans. Electron Devices
, vol.ED-26
, Issue.4
, pp. 453-461
-
-
Toyabe, T.1
Asai, S.2
-
6
-
-
0019659852
-
Physical mechanisms responsible for short channel effects in MOS devices
-
T. Nguyen and J. Plummer, "Physical mechanisms responsible for short channel effects in MOS devices," in IEDM Tech. Dig., 1981, vol. 27, pp. 596-599.
-
(1981)
IEDM Tech. Dig
, vol.27
, pp. 596-599
-
-
Nguyen, T.1
Plummer, J.2
-
7
-
-
0020194040
-
Short-channel MOST threshold voltage model
-
Oct
-
K. Ratnakumar and J. D.Meindl, "Short-channel MOST threshold voltage model," IEEE J. Solid-State Circuits, vol. SSC-17, no. 5, pp. 937-948, Oct. 1982.
-
(1982)
IEEE J. Solid-State Circuits
, vol.SSC-17
, Issue.5
, pp. 937-948
-
-
Ratnakumar, K.1
Meindl, J.D.2
-
8
-
-
0021518358
-
Two-dimensional analytical modeling of threshold voltages of short-channel MOSFETs
-
Nov
-
D. Poole and D. Kwong, "Two-dimensional analytical modeling of threshold voltages of short-channel MOSFETs," IEEE Electron Device Lett., vol. EDL-5, no. 11, pp. 443-446, Nov. 1984.
-
(1984)
IEEE Electron Device Lett
, vol.EDL-5
, Issue.11
, pp. 443-446
-
-
Poole, D.1
Kwong, D.2
-
9
-
-
0024737720
-
MOSFET scaling limits determined by subthreshold conduction
-
Sep
-
J. Pimbley and J. Meindl, "MOSFET scaling limits determined by subthreshold conduction," IEEE Trans. Electron Devices, vol. 36, no. 9, pp. 1711-1721, Sep. 1989.
-
(1989)
IEEE Trans. Electron Devices
, vol.36
, Issue.9
, pp. 1711-1721
-
-
Pimbley, J.1
Meindl, J.2
-
10
-
-
0031237614
-
Variational formulation of Poisson's equation in semiconductor at quasi-equilibrium and its applications
-
Sep
-
C.-Y. Lee, K. Lee, C.-K. Kim, and M.-U. Kim, "Variational formulation of Poisson's equation in semiconductor at quasi-equilibrium and its applications," IEEE Trans. Electron Devices, vol. 44, no. 9, pp. 1507-1513, Sep. 1997.
-
(1997)
IEEE Trans. Electron Devices
, vol.44
, Issue.9
, pp. 1507-1513
-
-
Lee, C.-Y.1
Lee, K.2
Kim, C.-K.3
Kim, M.-U.4
-
11
-
-
0038127214
-
Unified MOSFET scaling theory using the variational method
-
Nov
-
P. He, W. Chen, L. Tian, and Z. Li, "Unified MOSFET scaling theory using the variational method," Int. J. Electron., vol. 89, no. 11, pp. 821-831, Nov. 2002.
-
(2002)
Int. J. Electron
, vol.89
, Issue.11
, pp. 821-831
-
-
He, P.1
Chen, W.2
Tian, L.3
Li, Z.4
-
12
-
-
0022811028
-
A new approach to threshold voltage modelling of short-channel MOSFETS
-
Nov
-
T. Skotnicki and W. Marciniak, "A new approach to threshold voltage modelling of short-channel MOSFETS," Solid State Electron., vol. 29, no. 11, pp. 1115-1127, Nov. 1986.
-
(1986)
Solid State Electron
, vol.29
, Issue.11
, pp. 1115-1127
-
-
Skotnicki, T.1
Marciniak, W.2
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