Diameter analysis of rebundled single-wall carbon nanotubes using X-ray diffraction: Verification of chirality assignment based on optical spectra

Journal of Physical Chemistry C

Volumn 112, Issue 41, 2008, Pages 15997-16001

  Miyata, Yasumitsu ^a   Yanagi, Kazuhiro ^a,b   Maniwa, Yutaka ^b,c   Tanaka, Takeshi ^a   Kataura, Hiromichi ^a,b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c TOKYO METROPOLITAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHIRALITY; DIFFRACTION; ENANTIOMERS; GRAVIMETRIC ANALYSIS; LIGHT EMISSION; LUMINESCENCE; MICROSCOPIC EXAMINATION; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTUBES; SINGLE-WALLED CARBON NANOTUBES (SWCN); STEREOCHEMISTRY; SURFACE ACTIVE AGENTS; THERMOGRAVIMETRIC ANALYSIS; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CHIRALITY ASSIGNMENTS; DIAMETER DISTRIBUTIONS; OPTICAL-; PL INTENSITIES; PL MAPPINGS; PL MEASUREMENTS; SINGLE-WALL CARBON NANOTUBES; UNIFORM DIAMETERS; X-RAY DIFFRACTIONS; XRD ANALYSES; XRD MEASUREMENTS;

CARBON NANOTUBES;

EID: 55149112845     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp805018n     Document Type: Article

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