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Volumn 38, Issue 6 A/B, 1999, Pages
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Anomaly of X-ray diffraction profile in single-walled carbon nanotubes
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Author keywords
[No Author keywords available]
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Indexed keywords
ADSORPTION;
CARBON;
COMPUTER SIMULATION;
ELECTRIC ARCS;
ELECTRIC CONDUCTIVITY MEASUREMENT;
HEAT TREATMENT;
LATTICE CONSTANTS;
MATHEMATICAL MODELS;
THERMAL EFFECTS;
THERMOGRAVIMETRIC ANALYSIS;
X RAY CRYSTALLOGRAPHY;
ARC-DISCHARGE METHOD;
SINGLE-WALLED CARBON NANOTUBES (SWNT);
NANOTUBES;
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EID: 18544412765
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.38.l668 Document Type: Article |
Times cited : (59)
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References (12)
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